Study on ECR dry etching and selective MBE growth of AlGaN/GaN for fabrication of quantum nanostructures on GaN (0001) substrates

被引:5
|
作者
Oikawa, T [1 ]
Ishikawa, F
Sato, T
Hashizume, T
Hasegawa, H
机构
[1] Hokkaido Univ, RCIQE, Sapporo, Hokkaido 0608628, Japan
[2] Hokkaido Univ, Grad Sch Informat Sci & Technol, Sapporo, Hokkaido 0608628, Japan
关键词
GaN; AlGaN; quantum wire; selective MBE growth; dry etching;
D O I
10.1016/j.apsusc.2004.09.130
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This paper attempts to form AlGaN/GaN quantum wire (QWR) network structures on patterned GaN (0 0 0 1) substrates by selective molecular beam epitaxy (MBE) growth. Substrate patterns were prepared along < 1 1 2 0 > - and < 1 1 0 0 >-directions by electron cyclotron resonance assisted reactive-ion beam etching (ECR-RIBE) process. Selective growth was possible for both directions in the case of GaN growth, but only in the < 1 1 2 0 >-direction in the case of AlGaN growth. A hexagonal QWR network was successfully grown on a hexagonal mesa pattern by combining the < 1 1 2 0 >-direction and two other equivalent directions. AFM observation confirmed excellent surface morphology of the grown network. A clear cathodoluminescence (CL) peak coming from the embedded AlGaN/GaN QWR structure was clearly identified. (c) 2004 Published by Elsevier B.V.
引用
收藏
页码:84 / 87
页数:4
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