Angle-suppressed scattering and optical forces on submicrometer dielectric particles

被引：191

作者：

Nieto-Vesperinas, M. ^{[1
]}

Gomez-Medina, R. ^{[1
]}

Saenz, J. J. ^{[2
,3
]}

机构：

[1] CSIC, Inst Ciencia Mat Madrid, Madrid 28049, Spain

[2] Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain

[3] DIPC, Donostia San Sebastian 20018, Spain

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 2011年 / 28卷 / 01期

关键词：

ELECTROMAGNETIC FORCE; RADIATION PRESSURE; NEUTRAL PARTICLES; LIGHT-SCATTERING; REFLECTION; RESONANCES;

D O I：

10.1364/JOSAA.28.000054

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We show that submicrometer silicon spheres, whose polarizabilities are completely given by their two first Mie coefficients, are an excellent laboratory to test effects of both angle-suppressed and resonant differential scattering cross sections. Specifically, outstanding scattering angular distributions, with zero forward-or backward-scattered intensity, (i.e., the so-called Kerker conditions), previously discussed for hypothetical magnetodielectric particles, are now observed for those Si objects in the near infrared. Interesting new consequences for the corresponding optical forces are derived from the interplay, both in and out of resonance, between the electric-and magnetic-induced dipoles. (C) 2010 Optical Society of America

引用

页码：54 / 60

页数：7

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