Bayesian Reliability Assessment Based on Dirichlet Prior Information

被引:0
|
作者
Su, Hongsheng [1 ]
机构
[1] Lanzhou Jiaotong Univ, Sch Automat & Elect Engn, Lanzhou 730070, Peoples R China
来源
PROGRESS IN MEASUREMENT AND TESTING, PTS 1 AND 2 | 2010年 / 108-111卷
关键词
Reliability assessment; Dirichlet distribution; Bayesian method; Prediction;
D O I
10.4028/www.scientific.net/AMR.108-111.1147
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To resolve the reliability assessment of the large-sized complex products under small samples, with the aid of the Dirichlet prior distribution and Bayesian theory, a new method is proposed in this paper. The method can fully apply Dirichlet prior information and test data to estimate the reliabilities of the products, and forecasting the success times during the products test. Compared other methods, it is simple, direct, solid, and high-effective. The investigations show that the method is quit handy and effective.
引用
收藏
页码:1147 / 1151
页数:5
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