Effect of seeding density on the growth of diamond films by hot-filament chemical vapor deposition from sparse to dense range
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作者:
Anupam, K. C.
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Texas State Univ, Mat Sci Engn & Commercializat Program, San Marcos, TX 78666 USATexas State Univ, Mat Sci Engn & Commercializat Program, San Marcos, TX 78666 USA
Anupam, K. C.
[1
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Saha, Rony
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Texas State Univ, Mat Sci Engn & Commercializat Program, San Marcos, TX 78666 USATexas State Univ, Mat Sci Engn & Commercializat Program, San Marcos, TX 78666 USA
Saha, Rony
[1
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Anderson, Jonathan
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Texas State Univ, Dept Phys, San Marcos, TX 78666 USATexas State Univ, Mat Sci Engn & Commercializat Program, San Marcos, TX 78666 USA
Anderson, Jonathan
[2
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Ayala, Anival
[1
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Engdahl, Christopher
[3
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Piner, Edwin L.
[1
,2
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Holtz, Mark W.
[1
,2
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机构:
[1] Texas State Univ, Mat Sci Engn & Commercializat Program, San Marcos, TX 78666 USA
[2] Texas State Univ, Dept Phys, San Marcos, TX 78666 USA
[3] Crystallume Inc, 3397 De La Cruz Blvd, Santa Clara, CA 95054 USA
A systematic study is reported on the effects of nano-diamond seeding density on the growth, quality, and morphology of diamond films. A process is described to examine nano-diamond seeding densities 4 x 10(8), 8 x 10(10), and 2 x 10(12) cm(-2) on silicon wafers. The diamond film is grown using hot-filament chemical vapor deposition with CH4/H-2/O-2 feed gases and varying growth time to determine properties at coalescence and as thickness increases. Polycrystalline morphology is examined by scanning electron and atomic force microscopy. Both vertical and lateral growth rates are found to be higher for sparse seeding prior to coalescence. Following coalescence, the growth rate is similar for all densities. The development of polycrystals is found to be influenced by the initial growth with smaller mean lateral size at higher seeding density and reduced surface roughness that also improves with thickness to reach & LSIM;90 nm at a thickness of 6.4 mu m. The crystal quality is examined by micro-Raman spectroscopy from the sample surfaces and line images from cross sections. Narrowing of the diamond phonon peak shows material quality to improve with the thickness, at a given seed density, and as density increases. Concomitant improvements are seen from the relative intensity of the diamond phonon and Raman bands from non-diamond carbon. Cross-section micro-Raman results suggest improved diamond film quality and crystallinity near the substrate interface as well as at the growth surface for the film grown with 2 x 10(12) cm(-2) seed density compared to 4 x 10(8) and 8 x 10(10) cm(-2). X-ray photoelectron spectroscopy confirms these trends at the diamond surface.
机构:
Natl Inst Adv Ind Sci & Technol, Res Inst Ubiquitous Energy Devices UBIQEN, Diamond Res Grp, Ikeda, Osaka 5638577, JapanNatl Inst Adv Ind Sci & Technol, Res Inst Ubiquitous Energy Devices UBIQEN, Diamond Res Grp, Ikeda, Osaka 5638577, Japan
Ohmagari, Shinya
Yamada, Hideaki
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Natl Inst Adv Ind Sci & Technol, Res Inst Ubiquitous Energy Devices UBIQEN, Diamond Res Grp, Ikeda, Osaka 5638577, JapanNatl Inst Adv Ind Sci & Technol, Res Inst Ubiquitous Energy Devices UBIQEN, Diamond Res Grp, Ikeda, Osaka 5638577, Japan
Yamada, Hideaki
Umezawa, Hitoshi
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Natl Inst Adv Ind Sci & Technol, Res Inst Ubiquitous Energy Devices UBIQEN, Diamond Res Grp, Ikeda, Osaka 5638577, JapanNatl Inst Adv Ind Sci & Technol, Res Inst Ubiquitous Energy Devices UBIQEN, Diamond Res Grp, Ikeda, Osaka 5638577, Japan
Umezawa, Hitoshi
Chayahara, Akiyoshi
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Natl Inst Adv Ind Sci & Technol, Res Inst Ubiquitous Energy Devices UBIQEN, Diamond Res Grp, Ikeda, Osaka 5638577, JapanNatl Inst Adv Ind Sci & Technol, Res Inst Ubiquitous Energy Devices UBIQEN, Diamond Res Grp, Ikeda, Osaka 5638577, Japan
Chayahara, Akiyoshi
Teraji, Tokuyuki
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NIMS, Wide Bandgap Mat Grp, Opt & Elect Mat Unit, Tsukuba, Ibaraki 3050044, JapanNatl Inst Adv Ind Sci & Technol, Res Inst Ubiquitous Energy Devices UBIQEN, Diamond Res Grp, Ikeda, Osaka 5638577, Japan
Teraji, Tokuyuki
Shikata, Shin-ichi
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Natl Inst Adv Ind Sci & Technol, Res Inst Ubiquitous Energy Devices UBIQEN, Diamond Res Grp, Ikeda, Osaka 5638577, JapanNatl Inst Adv Ind Sci & Technol, Res Inst Ubiquitous Energy Devices UBIQEN, Diamond Res Grp, Ikeda, Osaka 5638577, Japan
机构:
Cent S Univ, Sch Mat Sci & Engn, Changsha 410083, Hunan, Peoples R China
Univ Bristol, Sch Chem, Bristol BS8 1TS, Avon, England
Cent S Univ, State Key Lab Powder Met, Changsha 410083, Hunan, Peoples R ChinaCent S Univ, Sch Mat Sci & Engn, Changsha 410083, Hunan, Peoples R China
Wei, Qiuping
Ashfold, Michael N. R.
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Univ Bristol, Sch Chem, Bristol BS8 1TS, Avon, EnglandCent S Univ, Sch Mat Sci & Engn, Changsha 410083, Hunan, Peoples R China
Ashfold, Michael N. R.
Mankelevich, Yu A.
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Moscow MV Lomonosov State Univ, Skobeltsyn Inst Nucl Phys, Moscow 119991, RussiaCent S Univ, Sch Mat Sci & Engn, Changsha 410083, Hunan, Peoples R China
Mankelevich, Yu A.
Yu, Z. M.
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Cent S Univ, Sch Mat Sci & Engn, Changsha 410083, Hunan, Peoples R ChinaCent S Univ, Sch Mat Sci & Engn, Changsha 410083, Hunan, Peoples R China
Yu, Z. M.
Liu, P. Z.
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Cent S Univ, Sch Mat Sci & Engn, Changsha 410083, Hunan, Peoples R ChinaCent S Univ, Sch Mat Sci & Engn, Changsha 410083, Hunan, Peoples R China
Liu, P. Z.
Ma, L.
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Cent S Univ, State Key Lab Powder Met, Changsha 410083, Hunan, Peoples R ChinaCent S Univ, Sch Mat Sci & Engn, Changsha 410083, Hunan, Peoples R China
机构:
Chinese Acad Sci, Inst Semicond, Lab Semicond Mat Science, Beijing 100083, Peoples R ChinaChinese Acad Sci, Inst Met Res, SYNL, Shenyang, Peoples R China
Liao, MY
Meng, XM
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机构:Chinese Acad Sci, Inst Met Res, SYNL, Shenyang, Peoples R China
Meng, XM
Zhou, XT
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机构:Chinese Acad Sci, Inst Met Res, SYNL, Shenyang, Peoples R China
Zhou, XT
Hu, JQ
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机构:Chinese Acad Sci, Inst Met Res, SYNL, Shenyang, Peoples R China
Hu, JQ
Wang, ZG
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机构:Chinese Acad Sci, Inst Met Res, SYNL, Shenyang, Peoples R China