NASA Goddard Space Flight Center's Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

被引：0

作者：

Topper, Alyson D. ^{[1
]}

O'Bryan, Martha V. ^{[1
]}

Casey, Megan C. ^{[2
]}

Lauenstein, Jean-Marie ^{[2
]}

Stansberry, Scott D. ^{[1
]}

Campola, Michael J. ^{[2
]}

Wilcox, Edward P. ^{[2
]}

Ladbury, Ray L. ^{[2
]}

Berg, Melanie D. ^{[1
]}

Wyrwas, Edward J. ^{[1
]}

Ryder, Kaitlyn

Label, Kenneth A. ^{[1
]}

Pellish, Jonathan A. ^{[2
]}

Majewicz, Peter J. ^{[2
]}

Cochran, Donna J. ^{[1
]}

机构：

[1] NASA, Goddard Space Flight Ctr, SSAI, Code 561-4, Greenbelt, MD 20771 USA

[2] NASA, GSFC, Code 561-4, Greenbelt, MD 20771 USA

来源：

2019 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) | 2019年

关键词：

D O I：

暂无

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

Total ionizing dose, displacement damage dose, and single-event effect testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, bipolar devices, and FPGAs.

引用

页码：117 / 126

页数：10

共 12 条

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[2]

Casey M. C., T NUCL SCI UNPUB

[3] Crocker Nuclear Laboratory (CNL) radiation effects measurement and test facility [J].

Castaneda, CM .

2001 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2001, :77-81

[4]

Department of Defense, 2013, MILSTD883 DEP DEF

[5]

JEDEC Government Liaison Committee, 2017, JESD57A

[6]

Johnson Michael B., 88 INCH CYCLOTRON AC

[7]

Label K. A., Are Current See Test Procedures Adequate for ModernDevices and Electronics Technologies

[8]

Lauenstein JM., 2019, IEEE Radiation Effects Data Workshop". In, P1, DOI DOI 10.1109/REDW.2019.8906528

[9]

Srinivasan R., 2016, SNUG SIL VALL MARCH

[10]

Stansberry Scott, 2018, SINGLE EVENT EFFECT

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