Effects of lithium doping and ultraviolet photo-patterning on electrical properties of InGaZnO thin film transistors

被引:6
作者
Jang, Jongsu [1 ]
Hong, Yongtaek [1 ]
机构
[1] Seoul Natl Univ, Interuniv Semicond Res Ctr ISRC, Dept Elect & Comp Engn, Seoul 08826, South Korea
关键词
Lithium doping; Ultraviolet photo-patterning; Solution-process; Thin film transistors; Indium gallium zinc oxide; LOW-TEMPERATURE; HIGH-MOBILITY; PERFORMANCE;
D O I
10.1016/j.tsf.2020.138098
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Alkali metals, such as Li and Na, have been added in solution-processed oxide thin-film transistors (TFTs) because they improved electrical characteristics of the oxide TFTs. In previous research, however, fine-patterning of the alkali metal-doped oxide layers was not performed due to potential performance degradation during photolithography process. In this work, we demonstrate ultraviolet (UV) photo-patterned solution-processed indium gallium zinc oxide (IGZO) TFTs containing various amount of lithium (Li). For patterning of active layer, we applied deep UV (184 nm, 10% and 254 nm, 90%) photo-patterning process. We also investigated the chemical composition and bonding structures of the Li doped IGZO (Li-IGZO) films. It was found that appropriate Li doping on IGZO films can reduce oxygen vacancies and improved the coordination of the metal-oxygen bonding. In addition, Li-IGZO TFTs showed improved mobility and bias stability compared to un-doped counterparts. We believe that this simple patterning process and Li doping can be applied to other types of the high-performance solution-processed oxide TFTs.
引用
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页数:7
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