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- [1] SURFACE-STRUCTURE AND ELECTRONIC PROPERTY OF REDUCED SRTIO3(100) SURFACE OBSERVED BY SCANNING TUNNELING MICROSCOPY SPECTROSCOPY JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (3B): : 1405 - 1409
- [2] Bias dependence of scanning tunneling microscopy images of Sr atoms adsorbed on SrTiO3(100) root 5x root 5 surfaces JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1996, 35 (12B): : L1692 - L1694
- [5] Study of the Si(111) "5 x 5"-Cu surface structure by X-ray diffraction and scanning tunneling microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2001, 40 (7A): : L695 - L697
- [6] Adsorption of fluorinated C60 on the Si(111)-(7 x 7) surface studied by scanning tunneling microscopy and high-resolution electron energy loss spectroscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (01): : 245 - 249
- [9] Preparation of an ultraclean and atomically controlled hydrogen-terminated si(111)-(1x1) surface revealed by high resolution electron energy loss spectroscopy, atomic force microscopy, and scanning Tunneling microscopy:: Aqueous NH4F etching process of si(111) JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (9A): : 5701 - 5705