Post annealing effect on transport properties of La0.67Ca0.33MnO3 films grown on vicinal cut substrates

被引：2
作者：
Yu, L. [1 ,2 ]
Wang, Y. [1 ]
Li, H. S. [1 ]
Liu, X. [1 ]
Zhang, P. X. [1 ,2 ]
机构：
[1] Kunming Univ Sci & Technol, Inst Adv Mat Photoelectrons, Kunming 650051, Peoples R China
[2] Max Planck Inst Solid State Res, D-70569 Stuttgart, Germany
来源：
JOURNAL OF ALLOYS AND COMPOUNDS | 2011年 / 509卷 / 37期
基金：
美国国家科学基金会;
关键词：
Thin films; Crystal growth; X-ray diffraction; Electronic transport; THIN-FILMS; DEPENDENCE;
D O I：
10.1016/j.jallcom.2011.07.010
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
La0.67Ca0.33MnO3 thin films have been grown on 10 degrees, 15 degrees, and 20 degrees vicinal cut SrTiO3 (100) substrates by pulse laser deposition. The single phase and the least textured growth have been studied by X-ray diffraction analysis. The post annealing effect with high temperature and high oxygen pressure on the transport properties of films has been investigated by resistance versus temperature measurements. Films with post annealing show large enhancement of metal-insulator transition temperature T-p about 20-30 K towards higher temperature and obvious decrease of resistance, which is attributed to the refilling of oxygen, the change of Mn-O-Mn angle and the improvement of crystallinity by the post annealing effect. Specially, film on 20 degrees vicinal cut substrate exhibits the biggest range gap of peak resistance drop, which may originate from more defects caused by steps at this tilt angle and many of these defects are removed after post annealing. (C) 2011 Elsevier B. V. All rights reserved.
引用
收藏
页码：8991 / 8993
页数：3
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