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- [13] The study of interferometer spectrometer based DSP and linear CCD OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS, 2010, 7855
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- [16] Testing mechatronic systems Determining simulation parameters for error tests ATP EDITION, 2016, (04): : 44 - 53
- [17] System of Measuring the Sub-pixel Edge of Linear CCD Based on Multi-scale Transform MATERIALS SCIENCE AND INFORMATION TECHNOLOGY, PTS 1-8, 2012, 433-440 : 6503 - 6508
- [19] Error Correction Research of Colorimetric Temperature-measurement Based on CCD PROCEEDINGS OF THE 31ST CHINESE CONTROL CONFERENCE, 2012, : 5649 - 5652
- [20] Rotary angle measuring system based on CCD ISTM/2007: 7TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-7, CONFERENCE PROCEEDINGS, 2007, : 4782 - 4784