Structural defects and degradation of high power pure-blue GaN-based laser diodes

被引:6
作者
Tomiya, Shigetaka [1 ]
Goto, Osamu [2 ]
Ikeda, Masao [1 ]
机构
[1] Sony Corp, Mat Lab, 4-6-1 Okata, Atsugi, Kanagawa 2430021, Japan
[2] Sony Corp, Laser Business Div, Atsugi, Kanagawa 2430021, Japan
来源
GALLIUM NITRIDE MATERIALS AND DEVICES III | 2008年 / 6894卷
关键词
pure-blue laser diodes; MOCVD; GaN substrate; GaInN alloy crystal; dislocation; inversion domain boundary; COD failure mode; current injection-free structure;
D O I
10.1117/12.767769
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In order to elongate lifetime of high power pure-blue GaN based laser diodes, reduction of newly created structural defects at active region, which consists of multiple quantum well structures, is inevitable. We, first, report on detailed structural analysis of this new type defects and discuss formation mechanism and reduction methodology of these defects. We, then, fabricated laser diodes with current injection-free structure at front facets, which is confirmed to be effective for suppression of degradation by catastrophic optical damage. We also discuss degradation mechanism of the laser diodes.
引用
收藏
页数:6
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