Advances in quantum computing fault tolerance and testing

被引：2

作者：

Feinstein, David Y. ^{[1
]}

Nair, V. S. S. ^{[1
]}

Thornton, Mitchell A. ^{[1
]}

机构：

[1] So Methodist Univ, Dept Comp Sci & Engn, Dallas, TX 75275 USA

来源：

HASE 2007: 10TH IEEE HIGH ASSURANCE SYSTEMS ENGINEERING SYMPOSIUM, PROCEEDINGS | 2007年

关键词：

D O I：

10.1109/HASE.2007.53

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

We study recent developments in quantum computing (QC) testing and fault tolerance (FT) techniques and discuss several attempts to formalize quantum logic fault models. We illustrate the inherent need for fault tolerance in QC due to the decoherence problem. Further, we examine several ideas regarding random testing and examine the viability of built-in-system-test (BIST) in future QC circuits.

引用

页码：369 / 370

页数：2

共 5 条

[1]

FEINSTEIN DY, 2007, THESIS SMU SCH ENG

[2]

Nielsen M.A., 2002, Quantum computation and quantum information, DOI DOI 10.1119/1.1463744

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Patel, KN ;

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IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2004, 23 (08) :1220-1230

[4]

PERLOWSKI MA, 2005, ISMVL 05, P146

[5] A family of logical fault models for reversible circuits [J].

Polian, I ;

Hayes, JP ;

Fiehn, T ;

Becker, B .

14TH ASIAN TEST SYMPOSIUM, PROCEEDINGS, 2005, :422-427

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