A digital and wide power bandwidth H-field generator for automatic test equipment

被引：0

作者：

Zhang, FM ^{[1
]}

Schiano, L ^{[1
]}

Meyer, FJ ^{[1
]}

Lee, YJ ^{[1
]}

Momenzadeh, M ^{[1
]}

Lombardi, F ^{[1
]}

Perkinson, P ^{[1
]}

Kane, T ^{[1
]}

Kim, YB ^{[1
]}

Max, S ^{[1
]}

机构：

[1] Northeastern Univ, Dept Elect & Comp Engn, Boston, MA 02115 USA

来源：

18TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS | 2003年

关键词：

D O I：

10.1109/DFTVS.2003.1250108

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Recent research on modeling timing jitter has raised a requirement for a predictable, high magnitude, uniform, and wide bandwidth H-field. In this paper, a novel H-field generator design methodology is proposed. It consists of a single layer air core solenoid and a digital power switch driver that takes advantage of low power, wide bandwidth, and big current-driven capability. With input overdrive voltage, the digital switch can drive rail-to-rail voltage with output current up to 16A and power bandwidth more than 3 MHz. This paper demonstrates a novel solenoid driver circuit to generate an accurate H-field by comparing digital and analog approaches and comparing the experimental data with the theoretical data.

引用

页码：159 / 166

页数：8