Facile Growth, Physical Characterization, and Dielectric Response of As-Grown NiO Nanostructures

被引:12
作者
Abdullah, M. M. [1 ]
机构
[1] Najran Univ, Coll Arts & Sci, Promising Ctr Sensors & Elect Devices, Dept Phys, POB 1988, Najran 11001, Saudi Arabia
关键词
Nanostructures; Rietveld analysis; Optical study; Dielectric properties; ELECTRICAL-PROPERTIES; NICKEL-OXIDE; FILMS; CHALCOGENIDE; RELAXATION; ABSORPTION; IMPEDANCE; BEHAVIOR; POWDERS;
D O I
10.1016/j.jksus.2019.09.009
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Nickel Oxide (NiO) nanostructures were prepared via the hydrothermal technique to examine the structure, optical, and dielectric properties. Various structural, and optical parameters: such as crystal structure, lattice parameter, average crystallite size, average micro-strain, peaks of stretching vibrations, and optical band gap, have been evaluated. Furthermore, the as-prepared NiO nanostructures were used as a dielectric material in a capacitor. Comparatively, the obtained high values of dielectric constant, and low values of dielectric loss show the potential applications of NiO nanostructures as a dielectric material. A possible mechanism has also been illustrated to explain the dielectric behaviour of the as-grown nanostructures. (C) 2019 The Author. Published by Elsevier B.V.
引用
收藏
页码:1048 / 1054
页数:7
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