A multi-wall carbon nanotube (MWCNT) relocation technique for atomic force microscopy (AFM) samples

被引：21
作者：
Cao, YZ [1 ]
Liang, YC
Dong, S
Wang, Y
机构：
[1] Harbin Inst Technol, Precis Engn Res Inst, Harbin 150001, Heilongjiang, Peoples R China
[2] Harbin Inst Technol, Dept Appl Chem, Harbin 150001, Heilongjiang, Peoples R China
来源：
ULTRAMICROSCOPY | 2005年 / 103卷 / 02期
基金：
高等学校博士学科点专项科研基金;
关键词：
AFM; MWCNT; relocate; block copolymer;
D O I：
10.1016/j.ultramic.2004.10.007
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
A simple relocation technique for atomic force microscopy (AFM), which takes advantage of multi-wall carbon nanotube (MWCNT), is used for investigating repeatedly the imaging of some specific species on the whole substrate with a high relocation accuracy of tens of nanometers. As an example of the application of this technique, Tapping Mode AFM ex situ study of the morphology transition induced by solvent treatment in a triblock copolymer thin film has been carried out. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：103 / 108
页数：6
相关论文
共 24 条
  • [1] PROTEIN IMAGES OBTAINED BY STM, AFM AND TEM
    ARAKAWA, H
    UMEMURA, K
    IKAI, A
    [J]. NATURE, 1992, 358 (6382) : 171 - &
  • [2] ATOMIC FORCE MICROSCOPE
    BINNIG, G
    QUATE, CF
    GERBER, C
    [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
  • [3] CAO YZ, 2003, POLYM PREPR, V44, P901
  • [4] DYNAMIC MECHANICAL-BEHAVIOR OF POLYSTYRENE-(ETHENE-CO-BUTENE)-POLYSTYRENE, TRIBLOCK COPOLYMER FILMS CAST FROM VARIOUS SOLVENTS
    COWIE, JMG
    LATH, D
    MCEWEN, IJ
    [J]. MACROMOLECULES, 1979, 12 (01) : 52 - 56
  • [5] The vacuolating toxin from Helicobacter pylori forms hexameric pores in lipid bilayers at low pH
    Czajkowsky, DM
    Iwamoto, H
    Cover, TL
    Shao, ZF
    [J]. PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 1999, 96 (05) : 2001 - 2006
  • [6] OBSERVATION AND MANIPULATION OF POLYMERS BY SCANNING TUNNELLING AND ATOMIC FORCE MICROSCOPY
    DOVEK, MM
    ALBRECHT, TR
    KUAN, SWJ
    LANG, CA
    EMCH, R
    GRUTTER, P
    FRANK, CW
    PEASE, RFW
    QUATE, CF
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 229 - 236
  • [7] Microdomain morphology of thin ABC triblock copolymer films
    Elbs, H
    Fukunaga, K
    Stadler, R
    Sauer, G
    Magerle, R
    Krausch, G
    [J]. MACROMOLECULES, 1999, 32 (04) : 1204 - 1211
  • [8] FRIENDBACHER G, SCIENCE, V253, P1261
  • [9] ATOMIC FORCE MICROSCOPY OF ATOMIC-SCALE LEDGES AND ETCH PITS FORMED DURING DISSOLUTION OF QUARTZ
    GRATZ, AJ
    MANNE, S
    HANSMA, PK
    [J]. SCIENCE, 1991, 251 (4999) : 1343 - 1346
  • [10] Defect evolution in ultrathin films of polystyrene-block-polymethylmethacrylate diblock copolymers observed by atomic force microscopy
    Hahm, J
    Lopes, WA
    Jaeger, HM
    Sibener, SJ
    [J]. JOURNAL OF CHEMICAL PHYSICS, 1998, 109 (23) : 10111 - 10114
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