Effect of rare earth doping on sol-gel derived PZT thin films

被引:6
作者
Majumder, SB [1 ]
Dobal, PS [1 ]
Roy, B [1 ]
Bhaskar, S [1 ]
Katiyar, RS [1 ]
机构
[1] Univ Puerto Rico, Dept Phys, San Juan, PR 00931 USA
关键词
PZT; thin film; rare earth doping; sol-gel; Raman scattering;
D O I
10.1080/07315170108202952
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We have studied the effect of rare earth dopants (Nd, Gd and Cc) on the phase formation behavior and electrical properties of sol-gel derived Pb-1.05(Zr0.53Ti0.47)O-3 thin films. In all these films the perovskite phase is obtained up to 5 at% doping and beyond that pyrochlore phase was found to coexist with the perovskite phase. Ce and Gd doping(1-2 at%) exhibited improved ferroelectric and dielectric properties as compared to the undoped PZT films. Nd doping (2 at%) was found to be effective to increase the retained switchable polarization of undoped PZT from 63% to 84%. The transition temperature of undoped PZT film was found to be reduced with Nd doping. The Nd doped films also exhibited typical relaxer behavior and a diffuse phase transition, characteristic of the relaxer material. Introduction of Nd into the PZT lattice probably introduces disorder in the B site of ABO(3) lattice which causes the observed relaxer behavior.
引用
收藏
页码:85 / 92
页数:8
相关论文
共 12 条
[1]  
Chae BG, 1996, INTEGR FERROELECTR, V13, P379
[2]   Structural studies of Nd-modified lead zirconate titanate ceramics between 11 and 680 K at the morphotropic phase boundary [J].
Frantti, J ;
Lantto, V .
PHYSICAL REVIEW B, 1997, 56 (01) :221-236
[3]   The effect of rare-earth (La, Sm, Dy, Ho and Er) and Mg on the microstructure in BaTiO3 [J].
Kishi, H ;
Kohzu, N ;
Sugino, J ;
Ohsato, H ;
Iguchi, Y ;
Okuda, T .
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 1999, 19 (6-7) :1043-1046
[4]   EFFECT OF NB DOPING ON THE MICROSTRUCTURE OF SOL-GEL-DERIVED PZT THIN-FILMS [J].
KLISSURSKA, RD ;
BROOKS, KG ;
REANEY, IM ;
PAWLACZYK, C ;
KOSEC, M ;
SETTER, N .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1995, 78 (06) :1513-1520
[5]  
Majumder SB, 1995, INTEGR FERROELECTR, V9, P271, DOI 10.1080/10584589508219661
[6]  
Majumder SB, 1999, FERROELECTRICS, V225, P1077
[7]  
Park HB, 1999, J AM CERAM SOC, V82, P94, DOI 10.1111/j.1151-2916.1999.tb01728.x
[8]   SOL-GEL PROCESSING OF NB-DOPED PB(ZR, TI)O3 THIN-FILMS FOR FERROELECTRIC MEMORY APPLICATIONS [J].
RYDER, DF ;
RAMAN, NK .
JOURNAL OF ELECTRONIC MATERIALS, 1992, 21 (10) :971-975
[9]   XPES STUDIES OF OXIDES OF 2ND-ROW AND 3RD-ROW TRANSITION-METALS INCLUDING RARE-EARTHS [J].
SARMA, DD ;
RAO, CNR .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 20 (1-2) :25-45
[10]   XPS STUDIES OF THE VALENCE BAND AND OF THE 4F AND 3D LEVELS OF CE HYDRIDES [J].
SCHLAPBACH, L ;
OSTERWALDER, J .
SOLID STATE COMMUNICATIONS, 1982, 42 (04) :271-274