Multi-frequency fringe projection profilometry based on wavelet transform

被引：16

作者：

Jiang, Chao ^{[1
]}

Jia, Shuhai ^{[1
]}

Dong, Jun ^{[1
]}

Lian, Qin ^{[1
,2
]}

Li, Dichen ^{[1
]}

机构：

[1] Xi An Jiao Tong Univ, Sch Mech Engn, Xian 710049, Peoples R China

[2] Shaanxi Hengtong Intelligent Machine Co Ltd, Xian 710049, Peoples R China

来源：

OPTICS EXPRESS | 2016年 / 24卷 / 11期

基金：

中国国家自然科学基金; 国家高技术研究发展计划(863计划);

关键词：

RECOVERY; PATTERNS; RIDGE;

D O I：

10.1364/OE.24.011323

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Based on wavelet transforms (WTs), an alternative multifrequency fringe projection profilometry is described. Fringe patterns with multiple frequencies are projected onto an object and the reflected patterns are recorded digitally. Phase information for every pattern is calculated by identifying the ridge that appears in WT results. Distinct from the phase unwrapping process, a peak searching algorithm is applied to obtain object height from the phases of the different frequency for a single point on the object. Thus, objects with large discontinuities can be profiled. In comparing methods, the height profiles obtained from the WTs have lower noise and higher measurement accuracy. Although measuring times are similar, the proposed method offers greater reliability. (C) 2016 Optical Society of America

引用

页码：1323 / 1333

页数：11

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