Prediction of the Strain Response of Poly-AlN/(100)Si Surface Acoustic Wave Resonator and Experimental Analysis

被引:1
作者
Chen, Shuo [1 ,2 ]
You, Zheng [1 ,2 ]
机构
[1] Tsinghua Univ, Dept Precis Instrument, Beijing 100084, Peoples R China
[2] Tsinghua Univ, State Key Lab Precis Measurement Technol & Instru, Beijing 100084, Peoples R China
关键词
surface acoustic wave resonator; aluminum nitride; strain coefficient factor; ELASTIC-CONSTANTS; TEMPERATURE; PRESSURE; SENSORS; SILICON;
D O I
10.3390/s16050603
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The strain sensitivity of the Aluminum Nitride (AlN)/Silicon (Si) surface acoustic wave resonator (SAWR) is predicted based on a modeling method introduced in this work, and further compared with experimental results. The strain influence on both the period of the inter-digital transducer (IDT) and the sound velocity is taken into consideration when modeling the strain response. From the modeling results, AlN and Si have opposite responses to strain; hence, for the AlN/Si-based SAWR, both a positive and a negative strain coefficient factor can be achieved by changing the thickness of the AlN layer, which is confirmed by strain response testing based on a silicon cantilever structure with two AlN configurations (1 mu m and 3 mu m in thickness, respectively).
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页数:13
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