How can a plenoptic camera be used as a metrology tool?

被引：0

作者：

Cai, Zewei ^{[1
]}

Liu, Xiaoli ^{[1
]}

Pedrini, Giancarlo ^{[2
]}

Osten, Wolfgang ^{[2
]}

Peng, Xiang ^{[1
]}

机构：

[1] Shenzhen Univ, Coll Phys & Optoelect Engn, Shenzhen 518060, Guangdong, Peoples R China

[2] Univ Stuttgart, Inst Tech Opt, Pfaffenwaldring 9, D-70569 Stuttgart, Germany

来源：

OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS VI | 2019年 / 11189卷

基金：

中国国家自然科学基金;

关键词：

Light field; structured illumination; calibration; three-dimensional measurement; DISTANCE;

D O I：

10.1117/12.2540184

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this paper, we propose a method for the structured-light field (SLF) 3D measurement, involving ray calibration and phase mapping. The ray calibration is carried out to determine each light ray with metric spatio-angular parameters. Base on the ray parametric equation, the phase mapping in the SLF is developed so that spatial coordinates could be directly mapped from phase-encoding information. Then, a calibration strategy is designed to determine the mapping coefficients for each light ray, achieving high-efficiency SLF 3D reconstruction.

引用

页数：7

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