Choosing Between Terminal and Independently Based Gain and Offset Error in the ADC Histogram Test

被引:7
作者
Alegria, Francisco Correa [1 ]
da Silva, Hugo Placido
机构
[1] Univ Tecn Lisboa, Inst Super Tecn, P-1049001 Lisbon, Portugal
关键词
Additive noise; analog-to-digital converter (ADC); gain and offset error estimation; histogram method; Monte Carlo method (MCM); precision of the estimators; PRECISION;
D O I
10.1109/TIM.2011.2161014
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To recover the analog voltage at the input of an analog-to-digital converter (ADC) from its digital output, one needs to know at least the ADC gain and offset. For high-accuracy measurements, it is necessary to estimate the actual values of these parameters since they are usually different from the ideal values (one and zero, respectively). This estimation inevitably has an uncertainty, which contributes to the uncertainty of any measurement made with the ADC. Here, the precision of gain and offset error estimators, based on the histogram method for ADC testing is analyzed. The "terminal based" and "independently based" definitions are compared, both through simulation and experimental evaluation. Our conclusion is that, in typical conditions, the "independently based" definition is more precise.
引用
收藏
页码:9 / 16
页数:8
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