Structure-change-dependent transmittance of PtOx thin film in super-resolution near-field structure:: Diffraction effect analysis

被引：4
作者：
Qu, Qingling [1 ]
Wang, Yang [1 ]
Gan, Fuxi [1 ]
机构：
[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China
来源：
PHYSICS LETTERS A | 2007年 / 368卷 / 3-4期
基金：
中国国家自然科学基金;
关键词：
Gaussian diffraction model; far-field; Super-RENS; micro-structural deformation;
D O I：
10.1016/j.physleta.2007.04.014
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
To study working mechanism of super-resolution near-field structure (super-RENS) optical disk from a far-field optics view is very necessary because of the actual far-field writing/readout process in the optical disk system. A Gaussian diffraction model based on Fresnel-Kirchhoff diffraction theory of PtOx-type super-RENS has been set up in this Letter. The relationship between micro-structural deformation (change of bubble structure and refractive index profile) with far-field optical response of PtOx thin film has been studied with it in detail. The simulation results are in good agreement with the experimental results reported in literatures with a designed configuration. These results may provide more quantitative information for better understanding of the working mechanism of metal-oxide-type super-RENS. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：271 / 275
页数：5
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