Widely changing probability of surface damage creation induced by a single ion in the MeV ion energy range

被引:4
作者
Ogiso, H
Tokumoto, H
Nakano, S
Yamanaka, K
机构
[1] Natl Inst Adv Interdisciplinary Res, Joint Res Ctr Atom Technol, Tsukuba, Ibaraki 305, Japan
[2] Mech Engn Lab, Tsukuba, Ibaraki 305, Japan
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1998年 / 16卷 / 04期
关键词
D O I
10.1116/1.590107
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report widely changing probability of surface damage creation induced by a single ion on highly oriented pyrolytic graphite specimens, each implanted with 3.1 MeV Si, Cu, As, Sr, Ag, or Au ions at a dose of 1.9x10(11) cm(-2). By using a friction force microscope, we observed lattice disordered surface damage, and found the probability of surface damage creation varying from 0.02 to 0.54 depending on the variation in the ion species. To determine the reason for the larger dependence on ion species, we calculated the probabilities of knock-on atom generation by nuclear collision. The calculated probability of knock-on atom generation agreed well with the observed probability of surface damage creation. (C) 1998 American Vacuum Society.
引用
收藏
页码:1914 / 1918
页数:5
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