Structural and magnetic properties of ion beam sputtered NiMnSb films

In this work the structural and magnetic properties of NiMnSb (NMS)-films deposited at different temperatures were investigated to determine optimal sample preparation conditions. Films of NMS were sputtered from a composite target onto heated(150-300 degrees C) Si(100) and MgO(100) substrates. The crystal structure was characterized by high angle X-ray diffraction, and polycrystalline samples with the typical Cl-b, structure were found for higher deposition temperatures. The roughness of the growth surface was investigated by X-ray reflectivity and X-ray diffuse scattering measurements. It was found to range from 13 to 60 Angstrom depending on the deposition temperature. Magnetization measurements confirmed ferromagnetic layers with a strong dependence of the coercive held on the deposition temperature. The saturation moments were found to be affected by deposition temperature and in all cases less than 2.5 mu(B), per Mn-site. (C) 1998 Elsevier Science B.V. All rights reserved.