Tip-enhanced stimulated Raman scattering with ultra-high-aspect-ratio tips and confocal polarization Raman spectroscopy for evaluation of sidewalls in Type II superlattices FPAs

被引：1

作者：

Chu, Fei-Hung ^{[1
]}

Smolyakov, G. A. ^{[1
]}

Wang, C. F. ^{[1
]}

Gao, Y. ^{[1
]}

Wang, C. ^{[1
]}

Malloy, K. J. ^{[1
]}

Ukhanov, A. A. ^{[1
]}

Pete, D. V. ^{[2
]}

Jaime-Vasquez, M. ^{[3
]}

Baril, N. F. ^{[3
]}

Benson, J. D. ^{[3
]}

Tenne, D. A. ^{[4
]}

机构：

[1] Actoprobe LLC, 800 Bradbury SE,Suite 160, Albuquerque, NM 87106 USA

[2] Sandia Natl Labs, CINT, Albuquerque, NM 87185 USA

[3] US Army, RDECOM CERDEC Night Vis & Elect Sensors Directora, RDER NVS IF, 10221 Burbeck Rd, Ft Belvoir, VA 22060 USA

[4] Boise State Univ, Dept Phys, 1910 Univ Dr, Boise, ID 83725 USA

来源：

NANOIMAGING AND NANOSPECTROSCOPY VI | 2018年 / 10726卷

关键词：

TERS; Infrared Detection; AFM; Confocal Raman spectroscopy; InAs/GaSb; Focal Plane Array; Dual-band imaging; AFM Active Optical probe; AAOP; NSOM; QUANTUM-DOT; RESONANCE; LINEWIDTH; EMISSION;

D O I：

10.1117/12.2504541

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Actoprobe team had developed custom Tip Enhancement Raman Spectroscopy System (TERS) with specially developed Ultra High Aspect Ratio probes for AFM and TERS measurements for small pixel infrared FPA sidewall characterization. Using this system, we report on stimulated Raman scattering observed in a standard tip-enhanced Raman spectroscopy (TERS) experiment on GaSb materials excited by 637-nm pump laser light. We explain our results by TERS-inherent mechanisms of enormous local field enhancement and by the special design and geometry of the ultra-high-aspect-ratio tips that enabled conditions for stimulated Raman scattering in the sample with greatly enhanced resonance Raman gain when aided by a microcavity to provide feedback mechanism for the Raman emission. The approach has great potential for further, orders-of-magnitude, progress in TERS enhancement by significantly increasing its nonlinear component. We report development of novel class of probes for atomic force microscopy (AFM active optical probe - AAOP) by integrating a laser source and a photodetector monolithically into the AFM probe. The AAOPs are designed to be used in a conventional AFM and would enhance its functionality to include that of the instruments (NSOM, TERS, hybrid AFM).

引用

页数：20

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