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- [41] Direct observation of cross-sectional potential distribution in GaN-based MIS structures by Kelvin-probe force microscopy PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 6, SUPPL 2, 2009, 6 : S968 - S971
- [42] Kelvin Probe Force Microscopy by Dissipative Electrostatic Force Modulation PHYSICAL REVIEW APPLIED, 2015, 4 (05):