Water desorption in Kelvin-probe force microscopy: a generic model

被引:3
|
作者
Mesquida, P. [1 ,2 ]
Kohl, D. [1 ]
Bansode, S. [3 ]
Duer, M. [3 ]
Schitter, G. [1 ]
机构
[1] TU Wien, Automat & Control Inst ACIN, Gusshausstr 27-29, A-1040 Vienna, Austria
[2] Kings Coll London, Dept Phys, London WC2R 2LS, England
[3] Univ Cambridge, Dept Chem, Lensfield Rd, Cambridge CB2 1EW, England
基金
英国工程与自然科学研究理事会;
关键词
Kelvin-probe force microscopy; atomic force microscopy; humidity; surface charge; decay; LABEL-FREE; FILMS;
D O I
10.1088/1361-6528/aae413
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Nanoparticles or similar, nanoscale objects such as proteins or biological fibrils usually have to be deposited from aqueous suspension onto a solid support surface for further characterization by atomic force microscopy (AFM) and related methods such as Kelvin-probe force microscopy (KFM). Here we show, on the examples of functionalized nanoparticles and collagen fibrils, that water desorption after sample preparation affects their electrostatic potential determined by KFM in a predictable manner. We explain this effect with a simple, analytical model based on the capacitance of the partially dielectric-filled tip-sample system. We also propose practical measures to avoid false interpretation of electrical AFM-based experiments. As the phenomenon is very generic it may have significant implications in the application of AFM to nanoparticles and other nanostructures including biological ones.
引用
收藏
页数:9
相关论文
共 50 条
  • [41] Probing CO on a rutile TiO2(110) surface using atomic force microscopy and Kelvin probe force microscopy
    Adachi, Yuuki
    Sugawara, Yasuhiro
    Li, Yan Jun
    NANO RESEARCH, 2022, 15 (03) : 1909 - 1915
  • [42] Probing CO on a rutile TiO2(110) surface using atomic force microscopy and Kelvin probe force microscopy
    Yuuki Adachi
    Yasuhiro Sugawara
    Yan Jun Li
    Nano Research, 2022, 15 : 1909 - 1915
  • [43] Improved Kelvin probe force microscopy for imaging individual DNA molecules on insulating surfaces
    Leung, Carl
    Maradan, Dario
    Kramer, Armin
    Howorka, Stefan
    Mesquida, Patrick
    Hoogenboom, Bart W.
    APPLIED PHYSICS LETTERS, 2010, 97 (20)
  • [44] Dynamic charge transfer between polyester and conductive fibres by Kelvin probe force microscopy
    Yin, Jun
    Vanderheyden, Benoit
    Nysten, Bernard
    JOURNAL OF ELECTROSTATICS, 2018, 96 : 30 - 39
  • [45] Characterization of graphene layers by Kelvin probe force microscopy and micro-Raman spectroscopy
    Nazarov, A. N.
    Gordienko, S. O.
    Lytvyn, P. M.
    Strelchuk, V. V.
    Nikolenko, A. S.
    Vasin, A. V.
    Rusavsky, A. V.
    Lysenko, V. S.
    Popov, V. P.
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 10, NO 7-8, 2013, 10 (7-8): : 1172 - 1175
  • [46] Scanning capacitance force microscopy and Kelvin probe force microscopy of nanostructures embedded in SiO2
    Tallarida, G
    Spiga, S
    Fanciulli, M
    SCANNING PROBE MICROSCOPY: CHARACTERIZATION, NANOFABRICATION AND DEVICE APPLICATION OF FUNCTIONAL MATERIALS, 2005, 186 : 405 - +
  • [47] Single-Molecule Recognition of Biomolecular Interaction via Kelvin Probe Force Microscopy
    Park, Jinsung
    Yang, Jaemoon
    Lee, Gyudo
    Lee, Chang Young
    Na, Sungsoo
    Lee, Sang Woo
    Haam, Seungjoo
    Huh, Yong-Min
    Yoon, Dae Sung
    Eom, Kilho
    Kwon, Taeyun
    ACS NANO, 2011, 5 (09) : 6981 - 6990
  • [48] Charge injection in large area multilayer graphene by ambient Kelvin probe force microscopy
    Bdikin, Igor
    Sharma, Dhanajay K.
    Otero-Lrurueta, Gonzalo
    Hortiguela, Maria J.
    Tyagi, Pawan K.
    Neto, Victor
    Singh, Manoj K.
    APPLIED MATERIALS TODAY, 2017, 8 : 18 - 25
  • [49] Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy-magnetic force microscopy combination
    Jaafar, Miriam
    Iglesias-Freire, Oscar
    Serrano-Ramon, Luis
    Ricardo Ibarra, Manuel
    Maria de Teresa, Jose
    Asenjo, Agustina
    BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2011, 2 : 552 - 560
  • [50] Correlated Kelvin-probe force microscopy, micro-FTIR and micro-Raman analysis of doping anisotropy in multisectorial boron-doped HPHT diamonds
    Nikolenko, A. S.
    Strelchuk, V. V.
    Lytvyn, P. M.
    Danylenko, I. M.
    Malyuta, S., V
    Gontar, O. G.
    Starik, S. P.
    Kovalenko, T., V
    Ivakhnenko, S. O.
    DIAMOND AND RELATED MATERIALS, 2022, 124