共 50 条
- [22] Kelvin probe force microscopy without bias-voltage feedback JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (8B): : 5626 - 5630
- [23] The role of the cantilever in Kelvin probe force microscopy measurements BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2011, 2 : 252 - 260
- [25] Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy JOVE-JOURNAL OF VISUALIZED EXPERIMENTS, 2014, (93): : e52327
- [28] Kelvin probe force microscopy in the presence of intrinsic local electric fields PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2011, 208 (04): : 777 - 789
- [29] Injection and Retention Characterization of Trapped Charges in Electret Films by Electrostatic Force Microscopy and Kelvin Probe Force Microscopy PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2020, 217 (20):