Water desorption in Kelvin-probe force microscopy: a generic model

被引:3
|
作者
Mesquida, P. [1 ,2 ]
Kohl, D. [1 ]
Bansode, S. [3 ]
Duer, M. [3 ]
Schitter, G. [1 ]
机构
[1] TU Wien, Automat & Control Inst ACIN, Gusshausstr 27-29, A-1040 Vienna, Austria
[2] Kings Coll London, Dept Phys, London WC2R 2LS, England
[3] Univ Cambridge, Dept Chem, Lensfield Rd, Cambridge CB2 1EW, England
基金
英国工程与自然科学研究理事会;
关键词
Kelvin-probe force microscopy; atomic force microscopy; humidity; surface charge; decay; LABEL-FREE; FILMS;
D O I
10.1088/1361-6528/aae413
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Nanoparticles or similar, nanoscale objects such as proteins or biological fibrils usually have to be deposited from aqueous suspension onto a solid support surface for further characterization by atomic force microscopy (AFM) and related methods such as Kelvin-probe force microscopy (KFM). Here we show, on the examples of functionalized nanoparticles and collagen fibrils, that water desorption after sample preparation affects their electrostatic potential determined by KFM in a predictable manner. We explain this effect with a simple, analytical model based on the capacitance of the partially dielectric-filled tip-sample system. We also propose practical measures to avoid false interpretation of electrical AFM-based experiments. As the phenomenon is very generic it may have significant implications in the application of AFM to nanoparticles and other nanostructures including biological ones.
引用
收藏
页数:9
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