Design aspects of microwave components with LTCC technique

被引:121
作者
Jantunen, H
Kangasvieri, T
Vähäkangas, J
Leppävuori, S
机构
[1] Univ Oulu, Microelect & Mat Phys Labs, FIN-90014 Oulu, Finland
[2] EMPART Res Grp Infotech Oulu, FIN-90014 Oulu, Finland
关键词
design; interconnects; LTCC; microwave ceramics;
D O I
10.1016/S0955-2219(03)00155-9
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Low temperature co-fired ceramic (LTCC) technology, widely used in the automotive industry, is now being employed in microwave applications. Several commercial materials with low dielectric losses at microwave frequencies and adequate thermomechanical properties have been introduced. Computer-aided design of three-dimensional circuits has also become available. These advances together with high-quality manufacturing technology have placed LTCCs at the forefront in the development of miniature microwave devices. The paper outlines LTCC technology placing emphasis on those essentials of the materials and processing technologies about which the microwave circuit designer needs to be aware. The discussion is illustrated by examples. The crucial issue of component reliability is also addressed. Although the integration of passive components into the structure improves reliability, the joints between the LTCC module and PCB remain as significant 'weak link'. Therefore, thermomechanical and structural design is a key to reliable LTCC assemblies. Finally, some future trends the LTCC technology for microwave applications are outlined. (C) 2003 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2541 / 2548
页数:8
相关论文
共 56 条
[1]   Modeling and characterization of the bonding-wire interconnection [J].
Alimenti, F ;
Mezzanotte, P ;
Roselli, L ;
Sorrentino, R .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2001, 49 (01) :142-150
[2]  
ALTACI S, 2001, P LOND COMM S LOND U
[3]  
Amey DI, 2000, PROC SPIE, V4339, P654
[4]  
Bailey A, 1997, IEEE MTT-S, P999, DOI 10.1109/MWSYM.1997.602970
[5]  
Barnwell P, 2000, P SOC PHOTO-OPT INS, V4339, P659
[6]  
BAUMANN G, 1995, IEEE MTT-S, P1639, DOI 10.1109/MWSYM.1995.406291
[7]  
Baumann G, 1997, 27TH EUROPEAN MICROWAVE 97, CONFERENCE + EXHIBITION - BRIDGING THE GAP BETWEEN INDUSTRY AND ACADEMIA, VOLS I AND II, P26
[8]  
BERRY C, 2002, P INT S MICR IMAPS B, P150
[9]  
BROWN R, 1997, P RF DES 97 C EXP EN, P209
[10]   Underfilled BGAs for ceramic BGA packages and board-level reliability [J].
Burnette, T ;
Johnson, Z ;
Koschmieder, T ;
Oyler, W .
50TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 2000 PROCEEDINGS, 2000, :1221-1226