Avalanche photodiodes as fast X-ray detectors

被引：20

作者：

Kishimoto, S ^{[1
]}

机构：

[1] Inst Mat Struct Sci, Photon Factory, Tsukuba, Ibaraki 305, Japan

来源：

JOURNAL OF SYNCHROTRON RADIATION | 1998年 / 5卷

关键词：

avalanche photodiodes; time resolution; fast counting;

D O I：

10.1107/S0909049598000053

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An avalanche photodiode (APD) detector provides a sub-nanosecond time resolution and an output rate of more than 10(8) counts s(-1) of synchrotron X-rays. Moreover, the APD has the advantage of low noise. A review of recent developments of detectors using APD devices designed for X-ray experiments is presented in this paper. One of the detectors has an excellent time response of 100 ps resolution and a narrow width on its response function, 1.4 ns at 10(-5) maximum. The other consists of a stack of four diodes and has a transmission structure. The stacked detector improved the efficiency for X-rays, e.g. 55% at 16.53 keV. The output rates reached more than 10(8) counts s(-1) per device.

引用

页码：275 / 279

页数：5

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