Analysis of lead oxide (PbO) layers for direct conversion X-ray detection

被引：62

作者：

Simon, M ^{[1
]}

Ford, RA ^{[1
]}

Franklin, AR ^{[1
]}

Grabowski, SP ^{[1
]}

Menser, B ^{[1
]}

Much, G ^{[1
]}

Nascetti, A ^{[1
]}

Overdick, M ^{[1
]}

Powell, MJ ^{[1
]}

Wiechert, DU ^{[1
]}

机构：

[1] Philips Res Labs, D-52066 Aachen, Germany

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2005年 / 52卷 / 05期

关键词：

contacts; detective quantum efficiency; direct detection; lead oxide; PbO; X-ray detector;

D O I：

10.1109/TNS.2005.856790

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Lead oxide (PbO) is a candidate direct conversion material for medical X-ray applications. We produced various samples and detectors with thick PbO layers. X-ray performance data such as dark current, charge generation yield and temporal behavior were evaluated on small samples. The influence of the metal contacts was studied in detail. We also covered large a-Si thin-film transistor (TFT)-plates with PbO. Imaging results from a large detector with an active area of 18 cm x 20 cm are presented. The detector has 960 x 1080 pixels with a pixel pitch of 184 mu m. The modulation transfer function at the Nyquist frequency of 2.72 line-pairs/mm is 50%. Finally, a full size X-ray image is presented.

引用

页码：2035 / 2040

页数：6

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