Reflectivity studies on a synchrotron radiation mirror in the hard X-ray regime

被引：3
|
作者：
Keil, P
Lützenkirchen-Hecht, D
Novikov, DV
Hahn, U
Frahm, R
机构：
[1] Berg Univ Gesamthsch Wuppertal, Inst Mat Wissensch, D-42097 Wuppertal, Germany
[2] Berg Univ Gesamthsch Wuppertal, Fachbereich Phys 8, D-42097 Wuppertal, Germany
[3] DESY, Hamburger Synchrontronstrahlungslab, D-22603 Hamburg, Germany
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 467卷
关键词：
X-ray mirror; X-ray reflectivity; diffuse scattering; X-ray scattering; GIXS;
D O I：
10.1016/S0168-9002(01)00304-7
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The optical performance and roughness parameters of an X-ray mirror that was used for several years in a synchrotron radiation beamline are determined by studying its X-ray reflectivity and diffuse scattering behavior. These values are compared to the data derived from topographic measurements with an atomic force microscope (AFM). (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：275 / 278
页数：4
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