Single molecule DNA device measured with triple-probe atomic force microscope

被引：98

作者：

Watanabe, H ^{[1
]}

Manabe, C ^{[1
]}

Shigematsu, T ^{[1
]}

Shimotani, K ^{[1
]}

Shimizu, M ^{[1
]}

机构：

[1] Fuji Xerox Co Ltd, Corp Res Ctr, Adv Res Lab, Minamiashigara, Kanagawa 2500111, Japan

来源：

APPLIED PHYSICS LETTERS | 2001年 / 79卷 / 15期

关键词：

D O I：

10.1063/1.1408604

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have measured the electric properties of a three-terminal single molecule DNA device with a triple-probe atomic force microscope (T-AFM). The T-AFM permits us to connect a single DNA molecule with carbon nanotube (CNT) electrodes as source, drain, and gate terminals. As the gate bias voltage is increased, the voltage gap region decreased in the current-voltage (I-V) curves. Furthermore, we can observe the clear steps in the I-V curve at crossing the DNA molecule and the CNT-gate electrode with gate biased. (C) 2001 American Institute of Physics.

引用

页码：2462 / 2464

页数：3

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