Three-dimensional discharge simulation of inductively coupled plasma (ICP) etching reactor

被引:4
作者
An YiRan [1 ]
Lu YiJia [1 ]
Li DongSan [2 ]
Chen YaoSong [1 ]
机构
[1] Peking Univ, Dept Mech, Beijing 100871, Peoples R China
[2] N Microelect Co Ltd, Beijing 100016, Peoples R China
来源
SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES | 2008年 / 51卷 / 06期
关键词
inductively coupled plasma; electron density; electron temperature; power deposition;
D O I
10.1007/s11431-008-0065-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
More and more importance has been attached to inductively coupled plasma (ICP) in semiconductor manufacture. For a deep understanding of the plasma discharge process in the etching reactor, this study made a three-dimensional simulation on the Ar plasma discharge process with the commercial software CFD-ACE, which is according to the real experiment conditions and data supplied by North Microelectronic Corporation. The error of the simulation results is in the range of +/- 20% with credibility. The numerical results show that the three-dimentional spatial distribution of electron density is reduced from the chamber center to the wall. The distribution of electron density, electron temperature and power deposition is related to the shape and placement of the coil.
引用
收藏
页码:674 / 682
页数:9
相关论文
共 13 条
[1]   ELECTRON-ENERGY DISTRIBUTION FUNCTION MEASUREMENTS IN A PLANAR INDUCTIVE OXYGEN RADIO-FREQUENCY GLOW-DISCHARGE [J].
BARNES, MS ;
FORSTER, JC ;
KELLER, JH .
APPLIED PHYSICS LETTERS, 1993, 62 (21) :2622-2624
[2]   Two-dimensional fluid model of an inductively coupled plasma with comparison to experimental spatial profiles [J].
Bukowski, JD ;
Graves, DB ;
Vitello, P .
JOURNAL OF APPLIED PHYSICS, 1996, 80 (05) :2614-2623
[3]  
Collison WZ, 1996, APPL PHYS LETT, V68, P903, DOI 10.1063/1.116225
[4]   2-DIMENSIONAL SELF-CONSISTENT FLUID SIMULATION OF RADIO-FREQUENCY INDUCTIVE SOURCES [J].
DIPESO, G ;
VAHEDI, V ;
HEWETT, DW ;
ROGNLIEN, TD .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (04) :1387-1396
[5]   Planar RF induction plasma coupling efficiency [J].
Hopwood, J. .
PLASMA SOURCES SCIENCE & TECHNOLOGY, 1994, 3 (04) :460-464
[6]   NOVEL RADIOFREQUENCY INDUCTION PLASMA PROCESSING TECHNIQUES [J].
KELLER, JH ;
FORSTER, JC ;
BARNES, MS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1993, 11 (05) :2487-2491
[7]   A three-dimensional model for inductively coupled plasma etching reactors: Azimuthal symmetry, coil properties, and comparison to experiments [J].
Kushner, MJ ;
Collison, WZ ;
Grapperhaus, MJ ;
Holland, JP ;
Barnes, MS .
JOURNAL OF APPLIED PHYSICS, 1996, 80 (03) :1337-1344
[8]   ELECTRON-DENSITY AND ENERGY-DISTRIBUTIONS IN A PLANAR INDUCTIVELY-COUPLED DISCHARGE [J].
MAHONEY, LJ ;
WENDT, AE ;
BARRIOS, E ;
RICHARDS, CJ ;
SHOHET, JL .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (04) :2041-2047
[9]   APPLICATION OF A HIGH-DENSITY INDUCTIVELY-COUPLED PLASMA REACTOR TO POLYSILICON ETCHING [J].
PATRICK, R ;
SCHOENBORN, P ;
TODA, H ;
BOSE, F .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1993, 11 (04) :1296-1300
[10]   A simple analysis of an inductive RF discharge [J].
Piejak, R. B. ;
Godyak, V. A. ;
Alexandrovich, B. M. .
PLASMA SOURCES SCIENCE & TECHNOLOGY, 1992, 1 (03) :179-186