Temperature dependence of carrier relaxation in strain-induced quantum dots

被引:62
|
作者
Braskén, M [1 ]
Lindberg, M
Sopanen, M
Lipsanen, H
Tulkki, J
机构
[1] Abo Akad Univ, Dept Phys, FIN-20520 Turku, Finland
[2] Helsinki Univ Technol, Optoelect Labs, FIN-02015 Espoo, Finland
[3] Helsinki Univ Technol, Lab Computat Engn, FIN-02015 Espoo, Finland
来源
PHYSICAL REVIEW B | 1998年 / 58卷 / 24期
关键词
D O I
10.1103/PhysRevB.58.R15993
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report experimental observation and theoretical interpretation of temperature-dependent, time-resolved luminescence from strain-induced quantum dots. The experimental results are well described by a master equation model for the electrons. The intraband relaxation in the conduction band and the radiative recombination rate are governed by the hole populations resulting in prominent temperature dependence of the relaxation process. Even when only a few electrons and holes are confined in a single quantum dot the Auger-like process provides a rapid intraband relaxation channel for electrons that can replace the phonon scattering as the dominant relaxation mechanism. [S0163-1829(98)51148-4].
引用
收藏
页码:15993 / 15996
页数:4
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