Numerical Simulation of Permanent Magnet Method: Applicability to Crack Detection in High-Temperature Superconducting Film

被引：2

作者：

Kamitani, Atsushi ^{[1
]}

Takayama, Teruou ^{[1
]}

Saitoh, Ayumu ^{[2
]}

机构：

[1] Yamagata Univ, Grad Sch Sci & Engn, Yamagata 9928510, Japan

[2] Univ Hyogo, Grad Sch Engn, Kobe, Hyogo 6712280, Japan

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2015年 / 51卷 / 03期

关键词：

Critical current density; high-temperature superconductors; integrodifferential equations; superconducting films; CRITICAL-CURRENT-DENSITY; 3RD-HARMONIC VOLTAGE;

D O I：

10.1109/TMAG.2014.2360934

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Applicability of the scanning permanent-magnet (SPM) method to crack detection in a high-temperature superconducting film is assessed by means of the numerical simulation. As a measure of crack detection, a defect parameter is defined by using the electromagnetic force acting on the film. After the defect parameter is calculated along various scanning lines, the sensitivity and the resolution are determined numerically. The results of computations show that both the sensitivity and the resolution are hardly affected by the scanning speed. On the other hand, the resolution of the SPM method is much inferior to that of the inductive method. In this sense, the SPM method is a high-speed but low-resolution method for detecting cracks.

引用

页数：4

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