Modeling MEMS Resonators Past Pull-In

被引:19
|
作者
Vyasarayani, Chandrika P. [1 ]
Abdel-Rahman, Eihab M. [1 ]
McPhee, John [1 ]
Birkett, Stephen [1 ]
机构
[1] Univ Waterloo, Waterloo, ON N2L 3G1, Canada
来源
关键词
CONTACT MODEL; ACTUATORS; DYNAMICS; DESIGN;
D O I
10.1115/1.4002835
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
In this paper, we develop a mathematical model of an electrostatic MEMS (Micro-Electro-Mechanical systems) beam undergoing impact with a stationary electrode subsequent to pull-in. We model the contact between the beam and the substrate using a nonlinear foundation of springs and dampers. The system partial differential equation is converted into coupled nonlinear ordinary differential equations using the Galerkin method. A numerical solution is obtained by treating all nonlinear terms as external forces. We use the model to predict the contact length, natural frequencies, and mode shapes of the beam past pull-in voltage as well as the dynamic response of a shunt switch in a closing and opening sequence. [DOI: 10.1115/1.4002835]
引用
收藏
页数:7
相关论文
共 50 条
  • [41] Pull-In Retarding in Nonlinear Nanoelectromechanical Resonators Under Superharmonic Excitation
    Kacem, Najib
    Baguet, Sebastien
    Hentz, Sebastien
    Dufour, Regis
    JOURNAL OF COMPUTATIONAL AND NONLINEAR DYNAMICS, 2012, 7 (02):
  • [42] Modeling the pull-in parameters of electrostatic actuators with a novel lumped two degrees of freedom pull-in model
    Bochobza-Degani, O
    Nemirovsky, Y
    SENSORS AND ACTUATORS A-PHYSICAL, 2002, 97-8 : 569 - 578
  • [43] UNCERTAINTY QUANTIFICATION OF PULL-IN PHENOMENON IN CAPACITIVE RF-MEMS
    Mathur, Sanjay
    Sun, Lin
    Das, Shankhadeep
    Peroulis, Dimitrios
    Koyacs, Andrew
    Zeng, Juan
    Murthy, Jayathi Y.
    PROCEEDINGS OF THE ASME INTERNATIONAL DESIGN ENGINEERING TECHNICAL CONFERENCES AND COMPUTERS AND INFORMATION IN ENGINEERING CONFERENCE, VOL 7, 2012, : 87 - 100
  • [44] Effect of Stress on Pull-in Voltage of RF MEMS SPDT Switch
    Bansal, Deepak
    Bajpai, Anuroop
    Kumar, Prem
    Kaur, Maninder
    Kumar, Amit
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2020, 67 (05) : 2147 - 2152
  • [45] Bounds to the pull-in voltage of a MEMS/NEMS beam with surface elasticity
    Radi, Enrico
    Bianchi, Giovanni
    Nobili, Andrea
    APPLIED MATHEMATICAL MODELLING, 2021, 91 : 1211 - 1226
  • [46] Jump and pull-in dynamics of an electrically actuated bistable MEMS device
    Ruzziconi, Laura
    Lenci, Stefano
    Younis, Mohammad I.
    CSNDD 2014 - INTERNATIONAL CONFERENCE ON STRUCTURAL NONLINEAR DYNAMICS AND DIAGNOSIS, 2014, 16
  • [47] Eloctrostatic Pull-in Characteristic of Silicon Diaphragm for MEMS Micropump Design
    Rosmani, R.
    Alabqari, Ahmad M. R.
    MALAYSIAN TECHNICAL UNIVERSITIES CONFERENCE ON ENGINEERING & TECHNOLOGY 2012 (MUCET 2012), 2013, 53 : 362 - 367
  • [48] Readout of MEMS capacitive sensors beyond the condition of pull-in instability
    Langfelder, G.
    Frizzi, T.
    Longoni, A.
    Tocchio, A.
    Manelli, D.
    Lasalandra, E.
    SENSORS AND ACTUATORS A-PHYSICAL, 2011, 167 (02) : 374 - 384
  • [49] Large-Stroke Capacitive MEMS Accelerometer Without Pull-In
    Daeichin, Meysam
    Miles, Ronald N.
    Towfighian, Shahrzad
    IEEE SENSORS JOURNAL, 2021, 21 (03) : 3097 - 3106
  • [50] APPLYING NUMERICAL CONTROL TO ANALYZE THE PULL-IN STABILITY OF MEMS SYSTEMS
    Zhang, Yanni
    Han, Yiman
    Zhao, Xin
    Zhao, Zhen
    Pang, Jing
    THERMAL SCIENCE, 2024, 28 (3A): : 2171 - 2178