Visualization of tip-surface geometry at atomic distance by TEM-STM holder

被引：28

作者：

Naitoh, Y ^{[1
]}

Takayanagi, K ^{[1
]}

Tomitori, M ^{[1
]}

机构：

[1] JAIST, TATSUNOKUCHI, ISHIKAWA 92312, JAPAN

来源：

SURFACE SCIENCE | 1996年 / 357卷 / 1-3期

关键词：

electron microscopy; field emission; field evaporation; gold; scanning tunneling microscopy; tungsten; tunneling;

D O I：

10.1016/0039-6028(96)00094-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

To clarify the tip-surface interaction of the scanning tunneling microscope (STM) by using a UHV transmission electron microscope (TEM), we specially designed a TEM-STM holder, In the present high-resolution electron microscope and diffraction studies, after applying a voltage of 50 V between W-tip and Au-surface at a distance of 70 nm in the feedback control mode of the tunneling current of 0.1 nA, the tip apex which has many protrusions was changed to one with a single protrusion. The tip was found to be cleaned and sharpened to the ideal conical shape, Al the tip apex a droplet was generated with the same [110] orientation as the tip, In addition to the sharpening of the tip, a droplet was generated on the Au-specimen surface. Generation of similar protrusions on the tip droplet occurred under applied bias voltage of usual STM operation.

引用

页码：208 / 212

页数：5

共 12 条

[1] TIP-SAMPLE INTERACTIONS IN THE SCANNING TUNNELING MICROSCOPE FOR ATOMIC-SCALE STRUCTURE FABRICATION [J].