Sensitivity of Z-scan using diffraction efficiency

被引：10
|
作者：
Fedus, K. [1 ]
Boudebs, G. [1 ]
机构：
[1] Univ Angers, UFR Sci, Lab Photon Angers, EA 4464, 2 Bd Lavoisier, F-49045 Angers 01, France
来源：
OPTICS COMMUNICATIONS | 2011年 / 284卷 / 04期
关键词：
Nonlinear optics; Z scan; Image processing; Diffraction; NONLINEAR REFRACTION; OPTICAL NONLINEARITY; ABSORPTION; SYSTEM; C-60;
D O I：
10.1016/j.optcom.2010.10.046
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We report Z-scan and eclipsing Z-scan experimental traces measuring diffraction efficiency in the image plane of the 4f system Using nonlinearly diffracted energy the sensitivity of both techniques is compared in order to Increase the signal-to noise ratio The optimization of the optical signal for nonlinear characterization is proposed A simple linear relation is provided in order to characterize nonlinear refraction from diffraction efficiency measurements The influence of the nonlinear absorption is discussed (C) 2010 Elsevier B V All rights reserved
引用
收藏
页码：1057 / 1061
页数：5
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