Imaging electron spin vector in semiconductors

被引：2
|
作者：
Teppe, F
Vladimirova, M
Scalbert, D
Nawrocki, M
Cibert, J
机构：
[1] Univ Montpellier 2, UMR 5650 CNRS, Etud Semicond Grp, F-34095 Montpellier, France
[2] Warsaw Univ, Inst Expt Phys, PL-00681 Warsaw, Poland
[3] UJF, CEA, CNRS, Grenoble Grp Nanophys & Semicond, F-38402 St Martin Dheres, France
来源：
SOLID STATE COMMUNICATIONS | 2003年 / 128卷 / 11期
关键词：
semiconductors; spin dynamics; time-resolved optical spectroscopy;
D O I：
10.1016/j.ssc.2003.09.005
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
A method for direct optical measurements of the electron spin polarization vector in semiconductors under transverse magnetic field is proposed. It is based on the time-resolved Kerr rotation experiments and provides picosecond resolution on the time-scale of several nanoseconds. The feasibility of the proposed technique is demonstrated on CdTe epitaxial films. (C) 2003 Elsevier Ltd. All rights reserved.
引用
收藏
页码：403 / 406
页数：4
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