A New Approach for Single-Event Effects Testing With Heavy Ion and Pulsed-Laser Irradiation: CMOS/SOI SRAM Substrate Removal

被引：20

作者：

Kanyogoro, Nderitu ^{[1
]}

Buchner, Stephen ^{[1
,2
]}

McMorrow, Dale ^{[2
]}

Hughes, Harold ^{[2
]}

Liu, Michael S. ^{[3
]}

Hurst, Al ^{[4
]}

Carpasso, Charles ^{[5
]}

机构：

[1] GTEC, Crofton, MD 21114 USA

[2] USN, Res Lab, Washington, DC 20375 USA

[3] TSS, Bloomington, MN 55437 USA

[4] Trusted Semicond Solut, Anoka, MN 55303 USA

[5] Freescale Semicond, Austin, TX 78535 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2010年 / 57卷 / 06期

关键词：

Heavy ions; laser; silicon substrate; single-event upset; SRAM;

D O I：

10.1109/TNS.2010.2085450

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A novel methodology for completely removing the silicon substrate of SOI devices for single-event effects testing is introduced and demonstrated using a 90 nm, 4 Mb SRAM test vehicle. Applications and significance are discussed.

引用

页码：3414 / 3418

页数：5

共 7 条

[1] *ASTM, F1192002006 ASTM
[2] Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM
Heidel, David F.
Marshall, Paul W.
Pellish, Jonathan A.
Rodbell, Kenneth P.
LaBel, Kenneth A.
Schwank, James R.
Rauch, Stewart E.
Hakey, Mark C.
Berg, Melanie D.
Castaneda, Carlos M.
Dodd, Paul E.
Friendlich, Mark R.
Phan, Anthony D.
Seidleck, Christina M.
Shaneyfelt, Marty R.
Xapsos, Michael A.
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2009, 56 (06) : 3499 - 3504
[3] Jeon J, 2007, CAN CON EL COMP EN, P963
[4] Radiation Test Challenges for Scaled Commercial Memories
LaBel, Kenneth A.
Ladbury, Ray L.
Cohn, Lewis M.
Oldham, Timothy R.
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2008, 55 (04) : 2174 - 2180
[5] Subbandgap laser-induced single event effects: Carrier generation via two-photon absorption
McMorrow, D
Lotshaw, WT
Melinger, JS
Buchner, S
Pease, RL
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2002, 49 (06) : 3002 - 3008
[6] CRITICAL-EVALUATION OF THE PULSED-LASER METHOD FOR SINGLE EVENT EFFECTS TESTING AND FUNDAMENTAL-STUDIES
MELINGER, JS
BUCHNER, S
MCMORROW, D
STAPOR, WJ
WEATHERFORD, TR
CAMPBELL, AB
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1994, 41 (06) : 2574 - 2584
[7] Mixed-Mode Simulation of Bit-Flip With Pulsed Laser
Rogelio Palomo, F.
Mogollon, J. M.
Napoles, J.
Aguirre, M. A.
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2010, 57 (04) : 1884 - 1891

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