Minimal C-testable tests for block-CLA adders

被引:4
作者
Moore, WR [1 ]
机构
[1] Univ Oxford, Dept Engn Sci, Oxford OX1 3PJ, England
关键词
D O I
10.1080/002072198133897
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper examines the testing of Carry Look-Ahead (CLA) adders and block-CLA adders with inter-block carry-ripple. By analysing the testing and fault-effect propagation of each stage of the adder, the paper derives minimal test sets for simple CLAs. The generality of these allows them to be assembled to produce minimal 'C-testable' test sets for block-CLA adders. The special cases of unequal block sizes and of no carry-in are also covered. The paper also examines the differing test requirements of the two different forms of CLA adders, the exclusive-OR form and the inclusive-OR form.
引用
收藏
页码:611 / 628
页数:18
相关论文
共 12 条
  • [11] WILKINS BR, 1986, TESTING DIGITAL CIRC
  • [12] WILKINSON B, 1987, DIGITAL SYSTEMS DESI