On line fault diagnosis of digital circuit

被引：0

作者：

Liang, YY ^{[1
]}

Huang, YH ^{[1
]}

Li, ZQ ^{[1
]}

机构：

[1] Ordnance Engn Coll, Shijiazhuang 050003, Peoples R China

来源：

ISTM/2003: 5TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-6, CONFERENCE PROCEEDINGS | 2003年

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this paper, test generation algorithm of PCB using LSI was introduced. Taken the test set as diagnosis support, the ways realizing board level testing and locating fault to IC was expound by VXI module instrument and expert system based on knowledge. Practice proofs that the test generation consuming less time and locating system fault precisely.

引用

页码：3409 / 3411

页数：3