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Study on CCD photoelectric thickness measurement instrument and system
被引：1
作者：
Meng, Z
[1
]
Fan, FJ
[1
]
机构：
[1] Yanshan Univ, Coll Elect Engn, Qinhuangdao 066004, Peoples R China
来源：
OPTOELECTRONIC DEVICES AND INTEGRATION, PTS 1 AND 2
|
2005年
/
5644卷
关键词：
Optical Trigonometry;
CCD;
video signal;
non-contact;
measurement;
detector;
thickness;
laser;
photoelectric transformation;
optical trigonometry;
D O I：
10.1117/12.575081
中图分类号：
TM [电工技术];
TN [电子技术、通信技术];
学科分类号：
0808 ;
0809 ;
摘要：
In this paper, optical trigonometry measurement principle and wok principle of linear CCD are introduced, which are based on to design optical focusing and imagery system with He-Ne laser instrument as illuminant. peripheral circuit of linear CCD is designed in theory and experiment. non-contact thickness measurement instrument is constructed, using CCD as photoelectric transformation element and microprocessor as the controller. The principle of measurement system is inclined trigonometry measurement principle and CCD is photoelectric transformation element. The time order driving circuit of CCD is designed.
引用
收藏
页码：607 / 613
页数：7
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