Nondestructive Differentiation of Polyester Single White Fibers Using Synchrotron Radiation Microbeam X-ray Fluorescence Spectrometry with Vertical Focusing*
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作者:
Nishiwaki, Yoshinori
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Kochi Univ, Fac Educ, 2-5-1 Akebono, Kochi 7808520, JapanKochi Univ, Fac Educ, 2-5-1 Akebono, Kochi 7808520, Japan
Nishiwaki, Yoshinori
[1
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Honda, Sadao
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机构:
SPring 8, Japan Synchrotron Radiat Res Inst, Res & Utilizat Div, 1-1-1 Kohto, Sayo, Hyogo 679-5198, JapanKochi Univ, Fac Educ, 2-5-1 Akebono, Kochi 7808520, Japan
Honda, Sadao
[2
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Yamato, Takuma
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机构:
Hiroshima Univ, Grad Sch Engn, Dept Appl Chem, 1-4-1 Kagamiyama, Hiroshima 7398527, JapanKochi Univ, Fac Educ, 2-5-1 Akebono, Kochi 7808520, Japan
Yamato, Takuma
[3
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Kondo, Ryosuke
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Hiroshima Univ, Grad Sch Engn, Dept Appl Chem, 1-4-1 Kagamiyama, Hiroshima 7398527, JapanKochi Univ, Fac Educ, 2-5-1 Akebono, Kochi 7808520, Japan
Kondo, Ryosuke
[3
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Kaneda, Atsunori
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Hiroshima Univ, Grad Sch Engn, Dept Appl Chem, 1-4-1 Kagamiyama, Hiroshima 7398527, JapanKochi Univ, Fac Educ, 2-5-1 Akebono, Kochi 7808520, Japan
Kaneda, Atsunori
[3
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Hayakawa, Shinjiro
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Hiroshima Univ, Grad Sch Engn, Dept Appl Chem, 1-4-1 Kagamiyama, Hiroshima 7398527, JapanKochi Univ, Fac Educ, 2-5-1 Akebono, Kochi 7808520, Japan
Hayakawa, Shinjiro
[3
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机构:
[1] Kochi Univ, Fac Educ, 2-5-1 Akebono, Kochi 7808520, Japan
[2] SPring 8, Japan Synchrotron Radiat Res Inst, Res & Utilizat Div, 1-1-1 Kohto, Sayo, Hyogo 679-5198, Japan
[3] Hiroshima Univ, Grad Sch Engn, Dept Appl Chem, 1-4-1 Kagamiyama, Hiroshima 7398527, Japan
In this study, the nondestructive differentiation of individual white polyester clothing fibers was accomplished via synchrotron radiation microbeam X-ray fluorescence (SR-mu-XRF) analysis. SR-mu-XRF with vertical focusing is a useful nondestructive method for the analysis of a single polyester clothing fiber. Kirkpatrick-Baez (KB) mirror was used to vertically focus 20 keV X-rays for the analysis of 22 individual white polyester fibers taken from clothing commonly sold in Japan. SR-mu-XRF with a vertical focused 2 mu m (V) x 300 mu m (H) beam was approximately 12.8 times more sensitive than SR-XRF with an unfocused 300 mu m (V) x 300 mu m (H) beam for the detection of elements in single fibers. The minimum detection limits (MDLs) of the SR-mu-XRF method were 8.15 ppm for Cl and 0.06 ppm for Br. In addition to Ti in TiO(2)delustering agents, Zr and Nb impurities in the delustering agents were detected in individual fibers. Sb from a polymerization catalyst and Co from a transesterification catalyst were also detected in individual fibers. Comparing the TiK beta/SbL(alpha,beta)and ZrK alpha/NbK alpha X-ray intensity ratios was a useful way to distinguish individual clothing fibers, and 98% of the fibers were differentiated when additional trace elements were used as discrimination indicators.
机构:
Chinese Acad Sci, Shanghai Adv Res Inst, Shanghai Synchrotron Radiat Facil, Shanghai 201204, Peoples R China
Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China
Univ Chinese Acad Sci, Beijing 100049, Peoples R ChinaChinese Acad Sci, Shanghai Adv Res Inst, Shanghai Synchrotron Radiat Facil, Shanghai 201204, Peoples R China
Huang Yu-ying
Zhong Xin-yu
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Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China
Univ Chinese Acad Sci, Beijing 100049, Peoples R ChinaChinese Acad Sci, Shanghai Adv Res Inst, Shanghai Synchrotron Radiat Facil, Shanghai 201204, Peoples R China
机构:
Bhabha Atom Res Ctr, Analyt Chem Div, Bombay, Maharashtra, India
Homi Bhabha Natl Inst, Bombay, Maharashtra, IndiaBhabha Atom Res Ctr, Analyt Chem Div, Bombay, Maharashtra, India
Ghosh, M.
Swain, K. K.
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Bhabha Atom Res Ctr, Analyt Chem Div, Bombay, Maharashtra, India
Homi Bhabha Natl Inst, Bombay, Maharashtra, IndiaBhabha Atom Res Ctr, Analyt Chem Div, Bombay, Maharashtra, India
Swain, K. K.
Devi, P. S. Remya
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Bhabha Atom Res Ctr, Analyt Chem Div, Bombay, Maharashtra, IndiaBhabha Atom Res Ctr, Analyt Chem Div, Bombay, Maharashtra, India
Devi, P. S. Remya
Chavan, T. A.
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Bhabha Atom Res Ctr, Analyt Chem Div, Bombay, Maharashtra, IndiaBhabha Atom Res Ctr, Analyt Chem Div, Bombay, Maharashtra, India
Chavan, T. A.
Singh, A. K.
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Raja Ramona Ctr Adv Technol, Synchrotrons Utilizat Sect, Indore, Madhya Pradesh, IndiaBhabha Atom Res Ctr, Analyt Chem Div, Bombay, Maharashtra, India
Singh, A. K.
Tiwari, M. K.
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Raja Ramona Ctr Adv Technol, Synchrotrons Utilizat Sect, Indore, Madhya Pradesh, IndiaBhabha Atom Res Ctr, Analyt Chem Div, Bombay, Maharashtra, India
Tiwari, M. K.
Verma, R.
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Bhabha Atom Res Ctr, Analyt Chem Div, Bombay, Maharashtra, IndiaBhabha Atom Res Ctr, Analyt Chem Div, Bombay, Maharashtra, India
机构:Beijing Normal Univ, Minist Educ, Key Lab Beam Technol & Mat Modificat, Beijing 100875, Peoples R China
Sun, Tianxi
Liu, Zhiguo
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机构:Beijing Normal Univ, Minist Educ, Key Lab Beam Technol & Mat Modificat, Beijing 100875, Peoples R China
Liu, Zhiguo
He, Bo
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机构:Beijing Normal Univ, Minist Educ, Key Lab Beam Technol & Mat Modificat, Beijing 100875, Peoples R China
He, Bo
Wei, Shiqiang
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机构:Beijing Normal Univ, Minist Educ, Key Lab Beam Technol & Mat Modificat, Beijing 100875, Peoples R China
Wei, Shiqiang
Xie, Yaning
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机构:Beijing Normal Univ, Minist Educ, Key Lab Beam Technol & Mat Modificat, Beijing 100875, Peoples R China
Xie, Yaning
Liu, Tao
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机构:Beijing Normal Univ, Minist Educ, Key Lab Beam Technol & Mat Modificat, Beijing 100875, Peoples R China
Liu, Tao
Hu, Tiandou
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机构:Beijing Normal Univ, Minist Educ, Key Lab Beam Technol & Mat Modificat, Beijing 100875, Peoples R China
Hu, Tiandou
Ding, Xunliang
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Beijing Normal Univ, Minist Educ, Key Lab Beam Technol & Mat Modificat, Beijing 100875, Peoples R ChinaBeijing Normal Univ, Minist Educ, Key Lab Beam Technol & Mat Modificat, Beijing 100875, Peoples R China