Conductive mode imaging of thermistor grain boundaries

被引：7
作者：
Seaton, J
Leach, C
机构：
[1] Univ Manchester, Manchester Mat Sci Ctr, Manchester M1 7HS, Lancs, England
[2] UMIST, Manchester M1 7HS, Lancs, England
来源：
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY | 2004年 / 24卷 / 06期
基金：
英国工程与自然科学研究理事会;
关键词：
BaTiO3; conductive mode; electron microscopy; grain boundaries; thermistor;
D O I：
10.1016/S0955-2219(03)00587-9
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
PTC thermistors undergo a rapid increase in grain boundary resistivity, covering several orders of magnitude, at temperatures just above the Curie temperature, T-C, which is associated with a ferroelectric to paraelectric phase transformation. In this study, hot-stage conductive mode scanning electron microscopy has been used to investigate the characteristics of individual thermistor grain boundaries over a range of temperatures around T-C. Using the remote electron beam induced current (REBIC) configuration, imaging has revealed EBIC contrast consistent with the presence of negatively charged electrostatic grain boundary barriers for the first time in a commercial thermistor. Not all grain boundaries within the thermistor were found to be EBIC active and the EBIC contrast was only observed at temperatures above T-C. EBSP analysis of grain boundary crystallography indicated that the EBIC active grain boundaries were predominantly high angle. (C) 2003 Elsevier Ltd. All rights reserved.
引用
收藏
页码：1191 / 1194
页数：4
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