Study of PPV polymer layers on Si substrates by mechanical spectroscopy

被引:0
|
作者
Strahl, A. [1 ]
Schrader, S. [2 ]
Katholy, S. [3 ]
Grimm, B. [2 ]
Neuhaeuser, H. [4 ]
机构
[1] Tech Univ Carolo Wilhelmina Braunschweig, Dept Phys, Inst Didact Sci, Braunschweig, Germany
[2] Univ Appl Sci, Fac Engn, Dept Phys, Wildau, Germany
[3] Univ Postdam, Inst Phys, Dept Condensed Matter Phys, Potsdam, Germany
[4] Tech Univ Carolo Wilhelmina Braunschweig, Inst Condensed Matter Phys, Braunschweig, Germany
来源
INTERACTION BETWEEN DEFECTS AND ANELASTIC PHENOMENA IN SOLIDS | 2008年 / 137卷
关键词
OLED; PPV; polymer; thin films; structural relaxation; damping peaks;
D O I
10.4028/www.scientific.net/SSP.137.189
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin layers of the OLED related polyphenylene-vinylene (PPV) deposited by a precursor on micro-fabricated Si cantilevers were studied by applying the vibrating-reed technique during repeated temperature cycling between 100 and 520 K. By means of the Langmuir-Blodgett method for film production, the dependence of damping and elastic modulus on well defined values of film thickness (16 to 69 nm) was determined. Simultaneous measurements of these quantities showed four damping peaks during heating around 130 K (called gamma), 250 K (beta), 350 K (beta'), and 400 K (called C). Three of them (gamma, beta', C) disappeared after heating to the highest temperature (520 K) indicating their presence in the precursor only. The activation parameters of the relaxation peaks (gamma, beta, beta') were estimated and assigned to specific atomic movements in the molecule. Peak C occurs during the conversion process of precursor to polymer. Earlier results are essentially substantiated, indicating only slight differences to those for layers produced previously by spin coating. The observed thickness dependence of damping for the gamma and beta peaks suggests a weaker contribution of molecules in the surface region than of those in the bulk, while the beta' peak is supposed to result from molecules in the interface region between layer and substrate.
引用
收藏
页码:189 / +
页数:2
相关论文
共 50 条
  • [21] LBIC characterization of LPE Si layers deposited on multicrystalline Si substrates
    Stemmer, M
    Wagner, G
    Martinuzzi, S
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1996, 42 (1-3): : 153 - 156
  • [22] Plastic relaxation in GeSi layers on Si (001) and Si (115) substrates
    Drozdov, Yu N.
    Drozdov, M. N.
    Yunin, P. A.
    Yurasov, D. V.
    Shaleev, M. A.
    Novikov, A. V.
    SEMICONDUCTORS, 2015, 49 (01) : 19 - 22
  • [23] Plastic relaxation in GeSi layers on Si (001) and Si (115) substrates
    Yu. N. Drozdov
    M. N. Drozdov
    P. A. Yunin
    D. V. Yurasov
    M. A. Shaleev
    A. V. Novikov
    Semiconductors, 2015, 49 : 19 - 22
  • [24] Single-molecule spectroscopy of the conjugated polymer MEH-PPV
    Hu, DH
    Yu, J
    Barbara, PF
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1999, 121 (29) : 6936 - 6937
  • [25] Lateral confined epitaxy of GaN layers on Si substrates
    Zamir, S
    Meyler, B
    Salzman, J
    JOURNAL OF CRYSTAL GROWTH, 2001, 230 (3-4) : 341 - 345
  • [27] Critical thickness and growth modes of SiC layers on Si substrates - a molecular dynamics study
    Bhatti, QA
    Matthai, CC
    APPLIED SURFACE SCIENCE, 1998, 123 : 7 - 10
  • [28] Spectral image cathodoluminescence, photoluminescence and Raman study of GaAs layers grown on Si substrates
    Martinez, O.
    Angulo, H.
    Avella, M.
    Gonzalez, M. A.
    Sanz, L. F.
    Jimenez, J.
    Gerard, B.
    Gil-Lafon, E.
    SUPERLATTICES AND MICROSTRUCTURES, 2009, 45 (4-5) : 214 - 221
  • [29] Secondary relaxations in heterocyclic polymer networks: A study of mechanical spectroscopy
    Carini, Giovanni, Jr.
    Carini, Giuseppe
    La Rocca, Sergio
    Tripodo, Gaspare
    Bartolotta, Antonio
    Di Marco, Gaetano
    Privalko, Eleonora G.
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2009, 521-22 : 251 - 254
  • [30] Localised plasma deposition of organosilicon layers on polymer substrates
    Theelen, Mirjam
    Habets, David
    Staemmler, Lutz
    Winands, Hans
    Bolt, Pieter
    SURFACE & COATINGS TECHNOLOGY, 2012, 211 : 9 - 13