Detection of a cosmetic defect on lenses using wavelets

被引：0

作者：

Almazan-Cuellar, Saul ^{[1
]}

Chacon-Aldama, Alfredo ^{[1
]}

Trujillo-Schiaffino, Gerardo ^{[1
]}

Salas-Peinbert, Didia ^{[1
]}

Corral-Martinez, Francisco ^{[1
]}

机构：

[1] Inst Tecnol Chihuahua, Chihuahua 31310, Mexico

来源：

RIAO/OPTILAS 2007 | 2008年 / 992卷

关键词：

cosmetic defects; discrete wavelets; wavelet transform;

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The cosmetic defects on lenses are a problem in the optical industry. They are an important source of economic looses due to rework. A method to detect the scratch defect is proposed. We will show that using the wavelet approach yields in a high performance method detecting these defects, making more reliable the inspection stage.

引用

页码：1117 / 1122

页数：6