Advances in ultrafast scanning tunneling microscopy

被引：43
|
作者：
Botkin, D
Glass, J
Chemla, DS
Ogletree, DF
Salmeron, M
Weiss, S
机构：
[1] UNIV CALIF BERKELEY,DEPT PHYS,BERKELEY,CA 94720
[2] UNIV CALIF BERKELEY,LAWRENCE BERKELEY NATL LAB,DIV MAT SCI,BERKELEY,CA 94720
来源：
APPLIED PHYSICS LETTERS | 1996年 / 69卷 / 09期
关键词：
D O I：
10.1063/1.117581
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Time resolved tunnel current was measured over 4 orders of magnitude in separation between tip and sample using an ultrafast scanning tunneling microscope (USTM). These measurements reveal two distinct regimes for tip height dependence of the signal. In addition, we report 900 femtosecond temporal resolution with a sensitivity of 20 mV/root Hz in USTM measurements of voltage pulses on a coplanar transmission line, and we show that the microscope operates as a high impedance probe. (C) 1996 American Institute of Physics.
引用
收藏
页码：1321 / 1323
页数：3
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