Quantitative interpretation of magnetic force microscopy images from soft patterned elements

被引:63
作者
García, JM
Thiaville, A
Miltat, J
Kirk, KJ
Chapman, JN
Alouges, F
机构
[1] Univ Paris 11, Phys Solides Lab, F-91405 Orsay, France
[2] CNRS, F-91405 Orsay, France
[3] Univ Glasgow, Dept Phys & Astron, Glasgow G12 8QQ, Lanark, Scotland
[4] Univ Paris 11, Math Lab, Orsay, France
关键词
D O I
10.1063/1.1389512
中图分类号
O59 [应用物理学];
学科分类号
摘要
By combining a finite element tip model and numerical simulations of the tip-sample interaction, it is shown that magnetic force microscopy images of patterned soft elements may be quantitatively compared to experiments, even when performed at low lift heights, while preserving physically realistic tip characteristics. The analysis framework relies on variational principles. Assuming magnetically hard tips, the model is both exact and numerically more accurate than hitherto achieved. (C) 2001 American Institute of Physics.
引用
收藏
页码:656 / 658
页数:3
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