Test procedure of indoor lighting LED luminaires based on step-stress accelerated degradation test

被引：0

作者：

Tian, Wanchun ^{[1
,2
]}

Cai, Miao ^{[1
]}

Zhang, Weihai ^{[1
]}

Tian, Kunmiao ^{[1
]}

Zhang, Ping ^{[1
]}

Chen, Xianping ^{[1
]}

Yang, Daoguo ^{[1
]}

机构：

[1] Guilin Univ Elect Technol, Guangxi Key Lab Mfg Syst & Adv Mfg Technol, Guilin 541004, Peoples R China

[2] Reliabil Res & Anal Ctr, CEPREI Lab, Guangzhou, Guangdong, Peoples R China

来源：

2015 16TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY | 2015年

关键词：

LED luminaires; system reliability; subsysetm; degradation; step stress;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

LED luminaire system has lots of failure modes. And the interaction among various failure mechanisms is extremely complex. There is a great obstacle existed in assessing the system reliability of LED luminaires. Therefore, in order to quickly and accurately assess the reliability of LED luminaires products, a test procedure for indoor lighting LED luminaires is initially proposed in this study. Firstly, according to the characteristics of LED luminaires, the sample size and corresponding confidence level are selected. Secondly, in order to overcome the influence of LED luminaire weaknesses on reliability assessment, LED luminaire is decomposed into several independent subsystems, and then step stress accelerated tests are conducted on the LED light source subsystem only, which is placed in a thermal chamber and connected to other subsystems outside the aging furnace. The test stress level, the step size, the measurement method and failure criteria are determined while considering that sample has a sufficient amount of degradation under each stress level. Finally, the reliability of LED luminaires is achieved after carrying out the degradation modeling, the distribution analysis and the reliability function calculation. The proposed procedure is further expected to be one of technical specifications on assessing the reliability of LED luminaire system in the future.

引用

页数：6

共 40 条

[21] Step Stress Accelerated Degradation Test Modeling and Remaining Useful Life Estimation in Consideration of Measuring Error [J].

Liu X.-P. ;

Zhang L.-J. ;

Shen K.-K. ;

Gao Q. .

Zhang, Li-Jie (ljzhang@ysu.edu.cn), 2017, China Ordnance Industry Corporation (38) :1586-1592

[22] Bayesian analysis for multiple step-stress accelerated life test model under gamma lifetime distribution and type-II censoring [J].

Moala, Fernando Antonio ;

Chagas, Karlla Delalibera .

INTERNATIONAL JOURNAL OF QUALITY & RELIABILITY MANAGEMENT, 2023, 40 (04) :1068-1091

[23] Unbiased estimations for the exponential distribution based on step-stress accelerated life-testing data [J].

Wang, BX .

APPLIED MATHEMATICS AND COMPUTATION, 2006, 173 (02) :1227-1237

[24] Optimal Setting of Test Conditions and Allocation of Test Units for Accelerated Degradation Tests With Two Stress Variables [J].

Fang, Guanqi ;

Pan, Rong ;

Stufken, John .

IEEE TRANSACTIONS ON RELIABILITY, 2021, 70 (03) :1096-1111

[25] Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products [J].

Peng, Chien-Yu ;

Tseng, Sheng-Tsaing .

IEEE TRANSACTIONS ON RELIABILITY, 2010, 59 (01) :30-37

[26] Data Fusion Method of Life Prediction Based on Accelerated Degradation Test [J].

Lin Fengchun ;

Ma Xiaobing ;

Chen Yunxia ;

Kang Rui .

MANAGEMENT ENGINEERING AND APPLICATIONS, 2010, :192-196

[27] Performance Degradation of Proton Exchange Membrane Fuel Cell Caused by an Accelerated Stress Test [J].

Zhang, X. ;

Yang, Y. ;

Zhang, X. ;

Guo, L. ;

Liu, H. .

FUEL CELLS, 2019, 19 (02) :160-168

[28] Realistic accelerated stress tests for PEM fuel cells: Test procedure development based on standardized automotive driving cycles [J].

Thiele, Paul ;

Yang, Yue ;

Dirkes, Steffen ;

Wick, Maximilian ;

Pischinger, Stefan .

INTERNATIONAL JOURNAL OF HYDROGEN ENERGY, 2024, 52 :1065-1080

[29] A Model-Ranking Approach for Estimation Based on Accelerated Degradation Test Data [J].

Li, Ling ;

Ng, Hon Keung Tony ;

Algarni, Ali H. ;

Almarashi, Abdullah M. ;

Abo-Eleneen, Zaher A. .

IEEE TRANSACTIONS ON RELIABILITY, 2020, 69 (02) :484-496

[30] Effect Study of Silicone Amount on the Lumen Maintenance of High Power LED under Accelerated Stress Test [J].

Chen, Qi ;

Hu, Run ;

Xie, Bin ;

Yu, Xingjian ;

Cheng, Jingjing ;

Luo, Xiaobing .

2016 15TH IEEE INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS (ITHERM), 2016, :836-840

← 1 2 3 4 →