X-ray phase contrast microscopy at 300 nm resolution with laboratory sources

被引：16

作者：

Pelliccia, Daniele ^{[1
]}

Sorrentino, Andrea ^{[2
]}

Bukreeva, Inna ^{[2
,3
]}

Cedola, Alessia ^{[2
]}

Scarinci, Fernando ^{[2
]}

Ilie, Mihaela ^{[2
]}

Gerardino, Anna Maria ^{[2
]}

Fratini, Michela ^{[2
]}

Lagomarsino, Stefano ^{[2
]}

机构：

[1] Monash Univ, Sch Phys, Clayton, Vic 3800, Australia

[2] CNR, IFN, I-00156 Rome, Italy

[3] Russian Acad Sci, PN Lebedev Phys Inst, Moscow 119991, Russia

来源：

OPTICS EXPRESS | 2010年 / 18卷 / 15期

关键词：

WAVE-GUIDE; SPATIAL-RESOLUTION; INTERFEROMETER; RADIATION; OBJECTS; BEAM;

D O I：

10.1364/OE.18.015998

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report the performance of an X-ray phase contrast microscope for laboratory sources with 300 nm spatial resolution. The microscope is based on a commercial X-ray microfocus source equipped with a planar X-ray waveguide able to produce a sub-micrometer x-ray beam in one dimension. Phase contrast images of representative samples are reported. The achieved contrast and resolution is discussed for different configurations. The proposed approach could represent a simple, inexpensive, solution for sub-micrometer resolution imaging with small laboratory setups. (C) 2010 Optical Society of America

引用

页码：15998 / 16004

页数：7

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